Prof. Dr. Franz J. Gießibl Chair of Experimental and Applied Physics University of Regensburg Tel: +49 (0)941943-2105 E-mail: [email protected] ...

An international research team led by Forschungszentrum Jülich has succeeded in visualizing magnetism inside solids with ...

Atomic force microscopy (AFM) is a highly useful instrument for material inspection, capable of scanning conductive and nonconductive samples without any restrictions as to the environment in which it ...

Using extremely high-resolution microscopy, Gieré, professor and chair of the Department of Earth and Environmental Science in Penn’s School of Arts & Sciences, and his coauthors found that not only ...

An atomic force microscope (AFM) is a scientific tool that is used to create detailed three-dimensional images of the surfaces of materials, down to the nanometer scale — that’s roughly on the scale ...

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The double layer structure of two ionic liquids (ILs), 1-butyl-1-methylpyrrolidinium tris (pentafluoroethyl)trifluorophosphate ( [Py 1,4]FAP) and 1-ethyl-3-methylimidazolium tris ...

Here we use a combination of noncontact atomic force microscopy (AFM) and density functional theory (DFT) to resolve O 2 adsorption on the rutile T i O 2 (110) surface, which presents a longstanding ...

Nitrogen (N)-doped graphene is a promising candidate for semiconducting devices and catalysts or sensor applications due to its controllable properties depending on the atomic structure of nitrogen ...

Contact mode Atomic Force Microscopy (CM-AFM) is popularly used by the biophysics community to study mechanical properties of cells cultured in petri dishes, or tissue sections fixed on microscope ...