Scanning Electron Microscopy (SEM) is an ideal observation tool for small scales robotics. It has the potential to achieve automated nano-robotic tasks such as nano-handling and nano-assembly. Path ...

Prof. Dr. Franz J. Gießibl Chair of Experimental and Applied Physics University of Regensburg Tel: +49 (0)941943-2105 E-mail: [email protected] ...

An international research team led by Forschungszentrum Jülich has succeeded in visualizing magnetism inside solids with ...

The evidence of a successful radial p–n junction formation in the NWs has been revealed through the help of a conducting atomic force microscope (AFM) scanning for the photogenerated currents on the ...

We have developed an atomic force microscopy-based method for detecting abasic sites (AP sites) on individual DNA molecules. By using uracil and uracil DNA glycosylase, we first prepared a 250-bp DNA ...

Atomic force microscopy (AFM) is a highly useful instrument for material inspection, capable of scanning conductive and nonconductive samples without any restrictions as to the environment in which it ...