Design for test (DFT), also known as design for testability, is a process that incorporates rules and techniques in the design of a product to make testing easier. Structured design for test is a system methodology rather than a collection of discrete techniques.

Key topics include: core-based design, focusing on embedded cores and embedded memories; system-on-a-chip and ultra-large scale integrated design issues; AC scan, at-speed scan, and embedded DFT;...

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. · Most up-to-date coverage of design for testability.

Jul 2, 1999 · The purpose of this book is to introduce the basic concepts of test and design-for-test (DFT), and to then address the application of these concepts with an eye toward the trade-offs of the engineering budgets (area, frequency, power, etc.), the …

The purpose of this book is to introduce the basic concepts of test and design-for-test (DFT), and to then address the application of these concepts with an eye toward the trade-offs of the engineering budgets (silicon area, operating frequency target, power consumption, etc.), the business drivers, and the cost factors.

Provides testing strategies that address business needs for quality, reliability, and cost control. This book helps to optimize the engineering trade-offs between resources such as silicon area, operating frequency, and power consumption. Focusing on automatic test pattern generation (ATPG), it is for the engineers involved in design and testing.

We collectively refer to test-driven design practices as Design For Testability (DFT). This part of the book covers essential aspects of DFT. In Chapter 20, we will describe the basic concepts of DFT and structural testing. In Chapter 21, the scan design technique, the most popular implementation of structured testing, will be explained.